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  to our customers, old company name in catalogs and other documents on april 1 st , 2010, nec electronics corporation merged with renesas technology corporation, and renesas electronics corporation took over all the business of both companies. therefore, although the old company name remains in this document, it is a valid renesas electronics document. we appreciate your understanding. renesas electronics website: http://www.renesas.com april 1 st , 2010 renesas electronics corporation issued by: renesas electronics corporation (http://www.renesas.com) send any inquiries to http://www.renesas.com/inquiry.
notice 1. all information included in this document is current as of the date this document is issued. such information, however, is subject to change without any prior notice. before purchasing or using any renesas el ectronics products li sted herein, please confirm the latest product information with a renesas electronics sales office. also , please pay regular and careful attention to additional and different information to be disclosed by rene sas electronics such as that disclosed through our website. 2. renesas electronics does not assume any liability for infringeme nt of patents, copyrights, or other intellectual property ri ghts of third parties by or arising from the use of renesas electroni cs products or techni cal information descri bed in this document . no license, express, implied or otherwise, is granted hereby under any patents, copyri ghts or other intell ectual property right s of renesas electronics or others. 3. you should not alter, modify, copy, or otherwise misappropriate any re nesas electronics product, wh ether in whole or in part . 4. descriptions of circuits, software and other related informat ion in this document are provided only to illustrate the operat ion of semiconductor products and application examples. you are fully re sponsible for the incorporation of these circuits, software, and information in the design of your equipment. renesas electronics assumes no responsibility for any losses incurred by you or third parties arising from the use of these circuits, software, or information. 5. when exporting the products or technology described in this doc ument, you should comply with the applicable export control laws and regulations and follow the proc edures required by such laws and re gulations. you should not use renesas electronics products or the technology described in this docum ent for any purpose relating to mil itary applicati ons or use by the military, including but not l imited to the development of weapons of mass de struction. renesas electronics products and technology may not be used for or incor porated into any products or systems whose manufacture, us e, or sale is prohibited under any applicable dom estic or foreign laws or regulations. 6. renesas electronics has used reasonable care in preparing th e information included in this document, but renesas electronics does not warrant that such information is error free. renesas electronics assumes no liability whatsoever for any damages incurred by you resulting from errors in or omissions from the information included herein. 7. renesas electronics products ar e classified according to the following three quality grades: ?standard?, ?high quality?, an d ?specific?. the recommended applications for each renesas electronics product de pends on the product?s quality grade, as indicated below. you must check the qua lity grade of each renesas electronics pr oduct before using it in a particular application. you may not use any renesas electronics produc t for any application categorized as ?speci fic? without the prior written consent of renesas electronics. further, you may not use any renesas electronics product for any application for which it is not intended without the prior written consent of renesas electronics. re nesas electronics shall not be in any way liable for any damages or losses incurred by you or third partie s arising from the use of any renesas electronics product for a n application categorized as ?specific? or for which the product is not intende d where you have failed to obtain the prior writte n consent of renesas electronics. the quality grade of each renesas electronics product is ?standard? unless otherwise expressly specified in a renesas electr onics data sheets or data books, etc. ?standard?: computers; office equipmen t; communications e quipment; test and measurement equipment; audio and visual equipment; home electronic a ppliances; machine tools; personal electronic equipmen t; and industrial robots. ?high quality?: transportation equi pment (automobiles, trains, ships, etc.); traffic control systems; anti-disaster systems; an ti- crime systems; safety equipment; and medical equipment not specif ically designed for life support. ?specific?: aircraft; aerospace equipment; submersible repeaters; nuclear reactor control systems; medical equipment or systems for life support (e.g. artificial life support device s or systems), surgical im plantations, or healthcare intervention (e.g. excision, etc.), and any other applicati ons or purposes that pose a di rect threat to human life. 8. you should use the renesas electronics pr oducts described in this document within the range specified by renesas electronics , especially with respect to the maximum ra ting, operating supply voltage range, movement power volta ge range, heat radiation characteristics, installation and other product characteristics. renesas electronics shall have no liability for malfunctions o r damages arising out of the use of renesas electronics products beyond such specified ranges. 9. although renesas electronics endeavors to improve the quality and reliability of its produc ts, semiconductor products have specific characteristics such as the occurrence of failure at a certain rate a nd malfunctions under certain use conditions. fur ther, renesas electronics products are not subject to radiation resistance design. please be sure to implement safety measures to guard them against the possibility of physic al injury, and injury or damage caused by fire in the event of the failure of a renesas electronics product, such as safe ty design for hardware and software in cluding but not limited to redundancy, fire control and malfunction prevention, appropri ate treatment for aging degradation or an y other appropriate measures. because the evaluation of microcomputer software alone is very difficult , please evaluate the safety of the final products or system manufactured by you. 10. please contact a renesa s electronics sales office for details as to environmental matters such as the environmental compatibility of each renesas electronics product. please use renesas electronics products in compliance with all applicable laws and regulations that regul ate the inclusion or use of c ontrolled substances, including wi thout limitation, the eu rohs directive. renesas electronics assumes no liability for damage s or losses occurring as a result of your noncompliance with applicable laws and regulations. 11. this document may not be reproduced or duplicated, in any form, in w hole or in part, without prio r written consent of renes as electronics. 12. please contact a renesa s electronics sales office if you have any questi ons regarding the informat ion contained in this document or renesas electroni cs products, or if you have any other inquiries. (note 1) ?renesas electronics? as used in this document means renesas electronics corporation and also includes its majority- owned subsidiaries. (note 2) ?renesas electronics product(s)? means any product developed or manufactured by or for renesas electronics.
2000 mos integrated circuit pd8861 5400 pixels 3 color ccd linear image sensor data sheet document no. s15167ej4v0ds00 (4th edition) date published february 2006 ns cp (n) printed in japan the mark shows major revised points. the revised points can be easily searched by copying an "" in the pdf file and specifying it in the "find what:" field. the information in this document is subject to change without notice. before using this document, please confirm that this is the latest version. not all products and/or types are available in every country. please check with an nec electronics sales representative for availability and additional information. description the pd8861 is a color ccd (charge coupled device) linear image sensor which changes optical images to electrical signal and has the function of color separation. the pd8861 has 3 rows of 5400 pixels, and each row has a sing le-sided readout type of charge transfer register. and it has reset feed-through level clamp circuits and voltage am plifiers. therefore, it is suitable for 600 dpi/a4 color image scanners, color facsimiles and so on. features ? valid photocell : 5400 pixels 3 ? photocell pitch : 5.25 m ? photocell size : 5.25 5.25 m 2 ? line spacing : 42 m (8 lines) red line - green line, green line - blue line ? color filter : primary colors (red, green a nd blue), pigment filter (with light resistance 10 7 lx?hour) ? resolution : 24 dot/mm a4 (210 297 mm) size (shorter side) : 600 dpi us letter (8.5? 11?) size (shorter side) ? drive clock level : cmos output under 5 v operation ? data rate : 6 mhz max. ? power supply : +12 v ? on-chip circuits : reset feed-through level clamp circuits :: voltage amplifiers ordering information part number package pd8861cy-a ccd linear image sensor 22-pin plastic dip (10.16 mm (400)) remark the pd8861cy-a is a lead-free product.
data sheet s15167ej4v0ds 2 pd8861 block diagram 21 22 1 20 2 11 15 14 13 12 10 9 8 5 d14 d64 d65 d66 s5399 s5400 s1 s2 photocell (red) transfer gate ccd analog shift register d67 tg1 (blue) tg2 (green) tg3 (red) 1l 3 rb 2 1 2 1 gnd gnd v od v out 3 (red) v out 2 (green) v out 1 (blue) 4 clb d14 d64 d65 d66 s5399 s5400 s1 s2 photocell (green) transfer gate ccd analog shift register d67 d14 d64 d65 d66 s5399 s5400 s1 s2 photocell (blue) transfer gate ccd analog shift register d67
data sheet s15167ej4v0ds 3 pd8861 pin configuration (top view) ccd linear image sensor 22-pin plastic dip (10.16 mm (400)) ? pd8861cy-a caution connect the no connection pins (nc) to gnd. photocell structure diagram photocell array structure diagram (line spacing) blue photocell array 5.25 m green photocell array 5.25 m red photocell array 5.25 m 8 lines (42 m) 8 lines (42 m) 5.25 m 2.75 m m 2.5 channel stopper aluminum shield 1 2 3 4 5 6 7 8 9 10 11 nc v out 2 v out 1 nc 1 2 tg1 no connection nc no connection nc no connection output signal 2 (green) output signal 1 (blue) no connection shift register clock 1 shift register clock 2 transfer gate clock 2 (for green) v out 3 gnd tg3 output signal 3 (red) ground reset gate clock shift register clock 1 shift register clock 2 nc no connection nc no connection 5400 5400 5400 red green blue 1 1 1 transfer gate clock 1 (for blue) transfer gate clock 3 (for red) output drain voltage v od 1 2 gnd ground rb reset feed-through level clamp clock clb 1l last stage shift register clock 1 tg2 22 21 20 19 18 17 16 15 14 13 12
data sheet s15167ej4v0ds 4 pd8861 absolute maximum ratings (t a = + 25 c) parameter symbol ratings unit output drain voltage v od ? 0.3 to + 15 v shift register clock voltage v 1 , v 2 , v 1l ? 0.3 to + 8 v reset gate clock voltage v rb ? 0.3 to + 8 v reset feed-through level clamp clock voltage v clb ? 0.3 to + 8 v transfer gate clock voltage v tg1 to v tg3 ? 0.3 to + 8 v operating ambient temperature note t a 0 to + 60 c storage temperature t stg ? 40 to + 70 c note use at the condition wi thout dew condensation. caution product quality may suffer if the absolute m aximum rating is exceeded even momentarily for any parameter. that is, the absolute maximum ratings are rated values at which the product is on the verge of suffering physical damage, and therefor e the product must be used under conditions that ensure that the absolute maxi mum ratings are not exceeded. recommended operating conditions (t a = + 25 c) parameter symbol min. typ. max. unit output drain voltage v od 11.4 12.0 12.6 v shift register clock high level v 1h , v 2h , v 1lh 4.5 5.0 5.5 v shift register clock low level v 1l , v 2l , v 1ll ? 0.3 0 + 0.5 v reset gate clock high level v rbh 4.5 5.0 5.5 v reset gate clock low level v rbl ? 0.3 0 + 0.5 v reset feed-through level clamp clock high level v clbh 4.5 5.0 5.5 v reset feed-through level clamp clock low level v clbl ? 0.3 0 + 0.5 v transfer gate clock high level v tg1h to v tg3h 4.5 v 1h note v 1h note v transfer gate clock low level v tg1l to v tg3l ? 0.3 0 + 0.3 v data rate f rb ? 1.0 6.0 mhz note when transfer gate clock high level (v tg1h to v tg3h ) is higher than shift register clock high level (v 1h ), image lag can increase.
data sheet s15167ej4v0ds 5 pd8861 electrical characteristics t a = + 25 c, v od = 12 v, data rate (f rb ) = 1 mhz, storage time = 5.5 ms, input signal clock = 5 v p-p , light source : 3200 k halogen lamp + c-500s (infrared cut filter, t = 1 mm) + ha-50 (heat absorbing filter, t = 3 mm) parameter symbol test conditions min. typ. max. unit saturation voltage v sat 2.0 2.5 ? v red ser ? 0.420 ? lxs green seg ? 0.429 ? lxs saturation exposure blue seb ? 0.739 ? lxs photo response non-uniformity prnu v out = 1.0 v ? 6 20 % average dark signal ads light shielding ? 0.2 2.0 mv dark signal non-uniformit y dsnu light shielding ? 1.5 5.0 mv power consumption p w ? 360 540 mw output impedance z o ? 0.35 1 k ? red r r 4.15 5.94 7.72 v/lxs green r g 4.07 5.82 7.57 v/lxs response blue r b 2.36 3.38 4.39 v/lxs image lag il v out = 1.0 v ? 1.5 7.0 % offset level note 1 v os 4.0 5.5 7.0 v output fall delay time note 2 t d v out = 1.0 v ? 25 ? ns total transfer efficiency tte v out = 1.0 v, data rate = 6 mhz 92 98 ? % red ? 630 ? nm green ? 540 ? nm response peak blue ? 460 ? nm dr1 v sat /dsnu ? 1666 ? times dynamic range dr2 v sat / cds ? 2777 ? times reset feed-through noise note 1 rftn light shielding 0 750 1500 mv random noise (cds) cds light shielding, bit clamp mode ? 0.9 ? mv notes 1. refer to timing chart 2, 3 . 2. when the fall time of 1l (t1?) is the typ. value (refer to timing chart 2, 3 ).
data sheet s15167ej4v0ds 6 pd8861 input pin capacitance (t a = + 25 c, v od = 12 v) parameter symbol pin name pin no. min. typ. max. unit shift register clock pin capacitance 1 c 1 1 9 ? 300 ? pf 14 ? 300 ? pf shift register clock pin capacitance 2 c 2 2 8 ? 300 ? pf 15 ? 300 ? pf last stage shift register clock pin capacitance c l 1l 5 ? 10 ? pf reset gate clock pin capacitance c rb rb 3 ? 10 ? pf reset feed-through level clamp clock pin capacitance c clb clb 4 ? 10 ? pf transfer gate clock pin capacitance tg1 13 ? 100 ? pf tg2 12 ? 100 ? pf c tg tg3 10 ? 100 ? pf remark pin 9 and 14 ( 1), 8 and 15 ( 2) are each connected inside of the device.
data sheet s15167ej4v0ds 7 pd8861 timing chart 1 (for each color) note set the rb and clb (bit clamp mode) to high level during this period. and stop the rb pulse while the clb pulse is low level at line clamp mode. remark inverse pulse of the tg1 to tg3 can be used as clb at line clamp mode. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 61 62 63 64 65 66 5463 5464 5465 5466 5467 5468 5469 v out 1 to v out 3 rb clb (bit clamp mode) clb (line clamp mode) 1l note invalid photocell (3 pixels) invalid photocell (2 pixels) valid photocell (5400 pixels) optical black (49 pixels) 2 1 tg1 to tg3 note
data sheet s15167ej4v0ds 8 pd8861 timing chart 2 (bit clamp mode, for each color) symbol min. typ. max. unit t1, t2 0 25 ? ns t1?, t2? 0 5 ? ns t3 20 200 ? ns t4 40 300 ? ns t5, t6 0 5 ? ns t7 ? 5 note 50 ? ns t8 35 200 ? ns t9, t10 0 5 ? ns t11 10 50 ? ns note min. of t7 shows that the rb and clb overlap each other. v out clb rb 2 1 90% 10% 1l 90% 10% 90% 10% 90% 10% rftn v os t2 t1 t4 t6 t3 t5 t d 90% 10% t10 t8 t11 t7 t9 t2' t1' 10% clb rb 90% 90% t7
data sheet s15167ej4v0ds 9 pd8861 timing chart 3 (line clamp mode, for each color) symbol min. typ. max. unit t1, t2 0 25 ? ns t1?, t2? 0 5 ? ns t3 20 200 ? ns t4 40 300 ? ns t5, t6 0 5 ? ns v out clb rb 2 1 90% 10% 1l 90% 10% 90% 10% 90% 10% rftn v os t2 t1 t4 t6 t3 t5 t d t2' t1' 10% "h"
data sheet s15167ej4v0ds 10 pd8861 timing chart 4 symbol min. typ. max. unit t7 ? 5 note 3 50 ? ns t9, t10 0 5 ? ns t11 10 50 ? ns t12 3000 10000 50000 ns t13, t14 0 50 ? ns t15, t16 900 1000 ? ns t17, t18 200 400 ? ns t19 t12 t12 50000 ns t20, t21 0 50 ? ns t22, t23 0 350 ? ns notes 1. set the rb and clb (bit clamp mode) to high level during this period. 2. stop the rb pulse during this period. 3. min. of t7 shows that the rb and clb overlap each other. remark inverse pulse of the tg1 to tg3 can be used as clb. rb clb (bit clamp mode) 1l 2 tg1 to tg3 clb (line clamp mode) 1 10% 90% 90% 90% 90% 90% 90% 10% t12 t13 t17 t7 t19 t9 t20 t10 t23 t21 t22 t11 note 1 note 2 t18 t16 t15 t14
data sheet s15167ej4v0ds 11 pd8861 1, 2 cross points 1l, 2 cross points remark adjust cross points ( 1, 2) and ( 1l, 2) with input resistance of each pin. 2 1l 2.0 v or more 0.5 v or more 1 2 1.0 v to 4.0 v 1.0 v to 4.0 v
data sheet s15167ej4v0ds 12 pd8861 definitions of characteristic items 1. saturation voltage : v sat output signal voltage at whic h the response linearity is lost. 2. saturation exposure : se product of intensity of illumination (lx) and storag e time (s) when saturation of output voltage occurs. 3. photo response non-uniformity : prnu the output signal non-uniformity of all the valid pixels when the photosensitive surface is applied with the light of uniform illumination. this is calculated by the following formula. 4. average dark signal : ads average output signal voltage of all the va lid pixels at light shielding. this is calculated by the following formula. prnu (%) = x = x j : output voltage of valid pixel number j x x : maximum of ? x j ? x ? x 5400 j = 1 5400 x j 100 ? ? x register dark dc level v out x ? ads (mv) = d j : dark signal of valid pixel number j 5400 j = 1 5400 d j
data sheet s15167ej4v0ds 13 pd8861 5. dark signal non-uniformity : dsnu absolute maximum of the difference between ads and vo ltage of the highest or lowest output pixel of all the valid pixels at light shielding. this is calculated by the following formula. 6. output impedance : z o impedance of the output pins viewed from outside. 7. response : r output voltage divided by exposure (lxs). note that the response varies with a light source (spectral characteristic). 8. image lag : il the rate between the last output voltage and the next one after read out the data of a line. ads dsnu register dark dc level v out v out tg light v out on off v 1 il (%) = v 1 v out 100 d j : dark signal of valid pixel number j dsnu (mv) : maximum of ? d j ? ads ? j = 1 to 5400
data sheet s15167ej4v0ds 14 pd8861 9. random noise (cds) : cds random noise cds is defined as the standard deviation of a valid pixel output signal with 100 times (=100 lines) data sampling at dark (light shielding). cds is calculated by the following procedure. 1. one valid photocell in one reading is fixed as measurement point. 2. the output level is measured during the reset feed-th rough period which is averaged over 100 ns to get ?vd i ?. 3. the output level is measured duri ng the video output time averaged over 100 ns to get ?vo i ?. 4. the correlated double sampling output is defined by the following formula. vcds i = vd i ? vo i 5. repeat the above procedure (1 to 4) for 100 times (= 100 lines). 6. calculate the standard deviation cds using the following formula equation. cds (mv) = , v = i = 1 100 (vcds i ? v) 2 i = 1 100 vcds i 100 100 1 reset feed-through video output
data sheet s15167ej4v0ds 15 pd8861 standard characteristic curves (reference value) dark output temperature characteristic storage time output voltage characteristic (t a = +25 c) operating ambient temperature t a ( c) storage time (ms) 8 4 2 1 0.5 0.25 0.1 10 0 20304050 relative output voltage relative output voltage 2 1 0.2 0.1 1510 400 500 600 700 800 100 80 60 40 20 0 b b g r g response ratio (%) wavelength (nm) total spectral response characteristics (without infrared cut filter and heat absorbing filter) (t a = +25 c)
data sheet s15167ej4v0ds 16 pd8861 application circuit example caution connect the no connection pins (nc) to gnd. remark the inverters shown in the above applicatio n circuit example are the 74hc04 (data rate < 2 mhz) or the 74ac04 (2 mhz data rate < 6 mhz). v out 3 pd8861 v out 1 gnd nc nc nc nc gnd nc 1 2 2 tg3 clb 1l tg1 1 tg2 47 ? 4.7 ? 4.7 ? 4.7 ? 10 ? 10 ? 4.7 ? 47 ? 150 ? 10 ? 122 21 20 19 18 17 16 15 14 13 12 2 3 4 5 6 7 9 8 10 11 b3 v out 2 nc v od rb b2 +12 v 0.1 f 10 f/16 v 0.1 f 10 f/16 v tg 1 rb 2 clb b1 +5 v +5 v + 0.1 f 10 f/16 v + + 47 f/25 v b1 to b3 equivalent circuit + 12 v 100 ? 100 ? ccd v out 2sc945 2 k ?
data sheet s15167ej4v0ds 17 pd8861 package drawing 44.0 0.3 37.5 1st valid pixel 0.5 0.3 1 9.25 0.3 2.0 0.25 0.05 10.16 0.2 0.46 0.1 2.54 0.25 1.02 0.15 (5.42) 4.21 0.5 4.39 0.4 12 11 2.55 0.2 3 (1.79) 2 name dimensions refractive index plastic cap 42.9 8.35 0.7 1.5 1 1st valid pixel the center of the pin1 2 the surface of the ccd chip the top of the cap 3 the bottom of the package the surface of the ccd chip 22c-1ccd-pkg13-1 (unit : mm) 1 22 10.16 + 0.7 ? 0.2 ccd linear image sensor 22-pin plastic dip (10.16 mm (400) ) pd8861cy
data sheet s15167ej4v0ds 18 pd8861 recommended soldering conditions when soldering this product, it is highly recommended to observe the conditions as shown below. if other soldering processes are used, or if the soldering is performed under different conditions, please make sure to consult with our sales offices. type of through-hole device pd8861cy-a : ccd linear image senso r 22-pin plastic dip (10.16 mm (400)) process conditions partial heating method pin temperature : 300 c or below, heat time : 3 seconds or less (per pin) caution s 1. during assembly care should be taken to prevent solder or fl ux from contacting the plastic cap. the optical characteristics coul d be degraded by such contact. 2. soldering by the solder flow method may have deleterious effects on prevention of plastic cap soiling and heat resistance. so the method cannot be guaranteed.
data sheet s15167ej4v0ds 19 pd8861 notes on handling the packages cleaning the plastic cap dust and dirt protecting mounting of the package operate and storage environments ethyl alcohol methyl alcohol isopropyl alcohol n-methyl pyrrolidone etoh meoh ipa nmp the optical characteristics of the ccd will be degraded if the cap is scratched during cleaning. don?t either touch plastic cap surface by hand or have any object come in contact with plastic cap surface. should dirt stick to a plastic cap surface, blow it off with an air blower. for dirt stuck through electricity ionized air is recommended. and if the plastic cap surface is grease stained, clean with our recommended solvents. care should be taken when cleaning the surface to prevent scratches. we recommend cleaning the cap with a soft cloth moistened with one of the recommended solvents below. excessive pressure should not be applied to the cap during cleaning. if the cap requires multiple cleanings it is recommended that a clean surface or cloth be used. the following are the recommended solvents for cleaning the ccd plastic cap. use of solvents other than these could result in optical or physical degradation in the plastic cap. please consult your sales office when considering an alternative solvent. the application of an excessive load to the package may cause the package to warp or break, or cause chips to come off internally. particular care should be taken when mounting the package on the circuit board. don't have any object come in contact with plastic cap. you should not reform the lead frame. we recommended to use a ic-inserter when you assemble to pcb. also, be care that the any of the following can cause the package to crack or dust to be generated. 1. applying heat to the external leads for an extended period of time with soldering iron. 2. applying repetitive bending stress to the external leads. 3. rapid cooling or heating operate in clean environments. ccd image sensors are precise optical equipment that should not be subject to mechanical shocks. exposure to high temperatures or humidity will affect the characteristics. so avoid storage or usage in such conditions. keep in a case to protect from dust and dirt. dew condensation may occur on ccd image sensors when the devices are transported from a low-temperature environment to a high-temperature environment. avoid such rapid temperature changes. for more details, refer to our document "review of quality and reliability handbook" (c12769e) 1 2 electrostatic breakdown ccd image sensor is protected against static electricity, but destruction due to static electricity is sometimes detected. before handling be sure to take the following protective measures. 1. ground the tools such as soldering iron, radio cutting pliers of or pincer. 2. install a conductive mat or on the floor or working table to prevent the generation of static electricity. 3. either handle bare handed or use non-chargeable gloves, clothes or material. 4. ionized air is recommended for discharge when handling ccd image sensor. 5. for the shipment of mounted substrates, use box treated for prevention of static charges. 6. anyone who is handling ccd image sensors, mounting them on pcbs or testing or inspecting pcbs on which ccd image sensors have been mounted must wear anti-static bands such as wrist straps and ankle straps which are grounded via a series resistance connection of about 1 m ? . 4 3 recommended solvents solvents symbol
data sheet s15167ej4v0ds 20 pd8861 [memo]
data sheet s15167ej4v0ds 21 pd8861 [memo]
data sheet s15167ej4v0ds 22 pd8861 [memo]
data sheet s15167ej4v0ds 23 pd8861 1 2 3 4 voltage application waveform at input pin waveform distortion due to input noise or a reflected wave may cause malfunction. if the input of the cmos device stays in the area between v il (max) and v ih (min) due to noise, etc., the device may malfunction. take care to prevent chattering noise from entering the device when the input level is fixed, and also in the transition period when the input level passes through the area between v il (max) and v ih (min). handling of unused input pins unconnected cmos device inputs can be cause of malfunction. if an input pin is unconnected, it is possible that an internal input level may be generated due to noise, etc., causing malfunction. cmos devices behave differently than bipolar or nmos devices. input levels of cmos devices must be fixed high or low by using pull-up or pull-down circuitry. each unused pin should be connected to v dd or gnd via a resistor if there is a possibility that it will be an output pin. all handling related to unused pins must be judged separately for each device and according to related specifications governing the device. precaution against esd a strong electric field, when exposed to a mos device, can cause destruction of the gate oxide and ultimately degrade the device operation. steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it when it has occurred. environmental control must be adequate. when it is dry, a humidifier should be used. it is recommended to avoid using insulators that easily build up static electricity. semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. all test and measurement tools including work benches and floors should be grounded. the operator should be grounded using a wrist strap. semiconductor devices must not be touched with bare hands. similar precautions need to be taken for pw boards with mounted semiconductor devices. status before initialization power-on does not necessarily define the initial status of a mos device. immediately after the power source is turned on, devices with reset functions have not yet been initialized. hence, power-on does not guarantee output pin levels, i/o settings or contents of registers. a device is not initialized until the reset signal is received. a reset operation must be executed immediately after power-on for devices with reset functions. power on/off sequence in the case of a device that uses different power supplies for the internal operation and external interface, as a rule, switch on the external power supply after switching on the internal power supply. when switching the power supply off, as a rule, switch off the external power supply and then the internal power supply. use of the reverse power on/off sequences may result in the application of an overvoltage to the internal elements of the device, causing malfunction and degradation of internal elements due to the passage of an abnormal current. the correct power on/off sequence must be judged separately for each device and according to related specifications governing the device. input of signal during power off state do not input signals or an i/o pull-up power supply while the device is not powered. the current injection that results from input of such a signal or i/o pull-up power supply may cause malfunction and the abnormal current that passes in the device at this time may cause degradation of internal elements. input of signals during the power off state must be judged separately for each device and according to related specifications governing the device. notes for cmos devices 5 6
pd8861 the information in this document is current as of february, 2006. the information is subject to change without notice. for actual design-in, refer to the latest publications of nec electronics data sheets or data books, etc., for the most up-to-date specifications of nec electronics products. not all products and/or types are available in every country. please check with an nec electronics sales representative for availability and additional information. no part of this document may be copied or reproduced in any form or by any means without the prior written consent of nec electronics. nec electronics assumes no responsibility for any errors that may appear in this document. nec electronics does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of nec electronics products listed in this document or any other liability arising from the use of such products. no license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of nec electronics or others. descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. the incorporation of these circuits, software and information in the design of a customer's equipment shall be done under the full responsibility of the customer. nec electronics assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. while nec electronics endeavors to enhance the quality, reliability and safety of nec electronics products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. to minimize risks of damage to property or injury (including death) to persons arising from defects in nec electronics products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment and anti-failure features. nec electronics products are classified into the following three quality grades: "standard", "special" and "specific". the "specific" quality grade applies only to nec electronics products developed based on a customer- designated "quality assurance program" for a specific application. the recommended applications of an nec electronics product depend on its quality grade, as indicated below. customers must check the quality grade of each nec electronics product before using it in a particular application. the quality grade of nec e lectronics products is "standard" unless otherwise expressly specified in nec electronics data sheets or data books, etc. if customers wish to use nec electronics products in applications not intended by nec electronics, they must contact an nec electronics sales representative in advance to determine nec electronics' willingness to support a given application. (note) ? ? ? ? ? ? m8e 02. 11-1 (1) (2) "nec electronics" as used in this statement means nec electronics corporation and also includes its majority-owned subsidiaries. "nec electronics products" means any product developed or manufactured by or for nec electronics (as defined above). computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots. transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support). aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. "standard": "special": "specific":


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